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Search: "[ keyword: test ]" (120)
    Code Coverage Measurement in Configurable Software Product Line Testing
    Soobin Han, Jihyun Lee, Seoyeon Go KIPS Transactions on Software and Data Engineering, Vol. 11, No. 7, pp. 273-282, Jul. 2022
    https://doi.org/10.3745/KTSDE.2022.11.7.273
    Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage


    Image-Based Application Testing Method Using Faster D2-Net for Identification of the Same Image
    Chun Hye-Won, Jo Min-Seok, Han Sung-Soo, Jeong Chang-Sung KIPS Transactions on Software and Data Engineering, Vol. 11, No. 2, pp. 87-92, Feb. 2022
    https://doi.org/10.3745/KTSDE.2022.11.2.87
    Keywords: Application Test, Deep Learning, Image matching, Feature matching, Image Compare


    A Study on the Design of a Test Item Framework for Securing Reliability of Laundry Home Appliances Using IoT Functions
    Cho Kyoung-Rok, Park Woo Jung, Lee Eun-Ser KIPS Transactions on Software and Data Engineering, Vol. 11, No. 2, pp. 67-80, Feb. 2022
    https://doi.org/10.3745/KTSDE.2022.11.2.67
    Keywords: IoT Function, Quality Assurance, Commonality, Variability, Importance, Priority, t-Test Statistics Analysis, evaluation


    An Efficient Algorithm for NaiveBayes with Matrix Transposition
    Lee Jae Mun The KIPS Transactions:PartB , Vol. 11, No. 1, pp. 117-124, Feb. 2004
    10.3745/KIPSTB.2004.11.1.117


    Single Shot Detector for Detecting Clickable Object in Mobile Device Screen
    Min-Seok Jo, Hye-won Chun, Seong-Soo Han, Chang-Sung Jeong KIPS Transactions on Software and Data Engineering, Vol. 11, No. 1, pp. 29-34, Jan. 2022
    https://doi.org/10.3745/KTSDE.2022.11.1.29
    Keywords: Test Automation, Android Object Detection, Mobile Screen Detection, computer vision, Deep Learning


    The Fastest Path Search and Defect Inspection of Type (sLa-pRc)
    Kim Soon Ho, Lee Eun Ser, Kim Chi Su KIPS Transactions on Software and Data Engineering, Vol. 10, No. 10, pp. 385-390, Oct. 2021
    https://doi.org/10.3745/KTSDE.2021.10.10.385
    Keywords: SMT, SMD, Gantry, Moving Time, Vision Test


    Deep Learning Model Validation Method Based on Image Data Feature Coverage
    Chang-Nam Lim, Ye-Seul Park, Jung-Won Lee KIPS Transactions on Software and Data Engineering, Vol. 10, No. 9, pp. 375-384, Sep. 2021
    https://doi.org/10.3745/KTSDE.2021.10.9.375
    Keywords: Deep Learning, Coverage Testing, Image Feature Extraction, Validation Method, Dataset Splitting Method


    An Improvement Of Efficiency For kNN By Using A Heuristic
    Lee Jae Mun The KIPS Transactions:PartB , Vol. 10, No. 6, pp. 719-724, Oct. 2003
    10.3745/KIPSTB.2003.10.6.719


    MuGenFBD: Automated Mutant Generator for Function Block Diagram Programs
    Lingjun Liu, Eunkyoung Jee, Doo-Hwan Bae KIPS Transactions on Software and Data Engineering, Vol. 10, No. 4, pp. 115-124, Apr. 2021
    https://doi.org/10.3745/KTSDE.2021.10.4.115
    Keywords: Mutant Generation, Mutation Analysis, Function Block Diagram, Software Testing


    Failure Analysis of Aircraft Software Test Cases from a Perspective of Requirements Traceability
    Sung-Sub Kim, Hee-Tae Cho, Seonah Lee KIPS Transactions on Software and Data Engineering, Vol. 9, No. 11, pp. 357-366, Nov. 2020
    https://doi.org/10.3745/KTSDE.2020.9.11.357
    Keywords: software engineering, Aircraft Software, Requirement Traceability, Test Cases


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